The all new Chip-DSC 1 integrates all essential parts of DSC: furnace, sensor and electronics in a miniaturized housing. The chip-arrangement comprises the heater and temperature sensor in a chemically inert ceramic arrangement with metallic heater and temperature sensor.This arrangement allows superior reproducibility and due to the low mass outstanding temperature control and heating rates of up to 100 K/min. The integrated sensor is easily user exchangeable and available for a low cost.The integrated design of the chip-sensor delivers superior raw data, which enables a direct analysis without pre- or post-processing of heat flow data.The compact construction, leads to a significant reduction in production cost which can be passed on to our customers. The low energy consumption and unrivaled dynamic response result in unsurpassed performance of this revolutionary DSC-concept.

This measuring instrument simultaneously delivers the three material properties thermal conductivity, thermal diffusivity and specific heat after just a few minutes, regardless of whether you have placed the corresponding sensors in bulk solids, gels, pastes or plates or immersed them in liquids.

Sample preparation of solids is as simple as it is straightforward. One plane contact surface of each of two sample halves is sufficient for the sensor. Calibration is very simple and does not need to be performed before each measurement.
The THB measures absolute values with an accuracy that does not lag behind conventional plate or LaserFlash devices.

The HCS System permits the characterization of semiconductor devices regarding their electric transport properties, in particular Hall-mobility, Charge Carrier Concentration, Resistivity and Seebeck Coefficient. The integrated desktop setups offer a complimentary product line-up from a basic, manual operated, Hall Characterization stage to an automized high temperature stage up to the innovative Halbach configuration for the characterization of most challenging samples.

The systems can be equipped with different sample holder for various geometries and temperature requirements. An optional low temperature (LN2) attachments is available as well as a high temperature version up to 800°C, to ensure that all fields of application can be covered. Depending on the system configuration, either a permanent magnet, a water cooled electromagnet or a Halbach magnet provide magnetic field strength of up to 1 Tesla. The comprehensive Windows based software offers an easy to use graphical user interface to control the system parameters, define measurement procedures and temperature profiles as well as allows for an easy data evaluation, presentation and storage.

<h3>General informations</h3>
The LSR-1 System permits the characterization of metallic and semiconducting samples according to the well-known Van-der-Pauw (Resistivity) as well as static DC and slope Seebeck Coefficient measurement technique. It measures:

Electrical Resistivity and Seebeck Coefficient.

The compact desktop setup offers fully integrated sample holders for various temperature requirements. Optional low temperature (LN2) attachments and a heated version up to 200°C as well as a vacuum tight measurement chamber in combination with a selection of gas dosing systems ensures that all fields of application can be covered.

The comprehensive Windows based softwareprovides an easy to use user interface, includingwizards for setting up a measurement profile
and an integrated measurement data evaluation.