LSR-1
Available, delivery time: 3-4 weeks
Product information
General informations
The LSR-1 System permits the characterization of metallic and semiconducting samples according to the well-known Van-der-Pauw (Resistivity) as well as static DC and slope Seebeck Coefficient measurement technique. It measures:
Electrical Resistivity and Seebeck Coefficient.
The compact desktop setup offers fully integrated sample holders for various temperature requirements. Optional low temperature (LN2) attachments and a heated version up to 200°C as well as a vacuum tight measurement chamber in combination with a selection of gas dosing systems ensures that all fields of application can be covered.
The comprehensive Windows based softwareprovides an easy to use user interface, includingwizards for setting up a measurement profile
and an integrated measurement data evaluation.
Thermocouples
Replacement thermocouple type S for sample measurementsFor measurements from RT to 1600°C
Replacement thermocouple type k for sample measurementsFor measurements from -180°C to 700°C
Replacement thermocouple type S for furnace/susceptor measurementsFor measurements from RT to 1100°C
Reference materials
Reference sample for measurement of Seebeck coefficient and resistivityFor low temperature measurements (LSR LT)
Reference sample for measurement of Seebeck coefficient and resistivityFor measurements at high temperatures (LSR 800 & 1100)