Modular system design
For low temperature measurements (LSR LT)
For measurements at high temperatures (LSR 800 & 1100)
The LSR-1 System permits the characterization of metallic and semiconducting samples according to the well-known Van-der-Pauw (Resistivity) as well as static DC and slope Seebeck Coefficient measurement technique. It measures:
Electrical Resistivity and Seebeck Coefficient.
The compact desktop setup offers fully integrated sample holders for various temperature requirements. Optional low temperature (LN2) attachments and a heated version up to 200°C as well as a vacuum tight measurement chamber in combination with a selection of gas dosing systems ensures that all fields of application can be covered.
The comprehensive Windows based softwareprovides an easy to use user interface, includingwizards for setting up a measurement profile
and an integrated measurement data evaluation.
• Resistivity / Conductivity (Ohm*cm / S/cm)
• Seebeck Coefficient (µV/K)
• Modular system design. Can be upgraded with gas dosing system, illumination and Cryo-option
• Vacuum tight measurement chamber for measurements under defined atmospheres.
• Easy to use and exchangeable sample holders, with integrated primary and secondary heater.
• Integrated state of the art measurement electronics provides most accurate results for challenging samples.
• The unit can be used for simultaneous measurement of both Seebeck Coefficient and Electric Resistance (Resistivity).
• The sample holder uses a special contact mechanism, permitting measurement of high reproducibility.
• V-I plot measurement can be made to judge if the sensor is in good contact with the sample.
• Measurement is controlled by a computer, permitting automatic measurement with selected temperature difference a specified furnace temperature.
• Measured raw data is stored on disc.
• System comes with Constantan Reference incl. tables and certificate
Sample mounting board
Basic unit: Room temperature to 200°C (hot side temperature)
Cryo option: -160°C to 200°C (cold side and hot side temp.)
0.01 up to 100 K/min
+/-1.5K + or -0.25°%
Measuring Range / Method:
Integrated PCB Board with Primary and Secondary Heater
Seebeck Coeffecient measurement range: 0 to 2.5 mV/K
10-4 up to 107 (Ωcm)
0.5 nV/K (nV = 10-9 V)
10 nOhm (nOhm = 10-9 Ohm)
+/-6% (Semiconductor*) +/-4% (Metal*)
|+/-9% (Semiconductor*) +/-4% (Metal*)|
Inert, reducing, oxidising, vacuum
Low pressure helium gas or N2, recommended
230V / 110V 50Hz / 60 Hz
- Software packages are compatible with latest Windows operating system
- Set up menu entries
- All specific measuring parameters (User, Lab, Sample, Company, etc.)
- Optional password and user levels
- Undo and Redo function for all steps
- Infinite heating, cooling or dwell time segments
- Multiple language versions such as English, Germany, French, Spanish, Chinese, Japanese, Russian, etc. (user selectable)
- Evaluation software features a number of functions enabling a complete evaluation of all types of data
- Multiple smoothing models
- Complete evaluation history (all steps can be undone)
- Evaluation and data acquisition can be performed simultaneously
- Data can be corrected using zero and calibration correction
- Data evaluation includes: Peak separation software Signal correction and smoothing, first and second derivative, curve arithmetic, data peak evaluation, glass point evaluation, slope correction. Zoom / individual segment display, multiple curve overlay, annotation and drawing tools, copy to clip board function, multiple export features for graphic and data export, reference based correction
Seebeck voltage/temperature gradient (blue) measured while sweeping gradient heater power together with the linear regression (orange).
Seebeck coefficient is determined by the slope of the linear regression.
Seebeck coefficient measurement example of constant.